指導老師介紹

陳家豪 助理教授
國立成功大學電機工程博士

E-MAIL: jahaochen@thu.edu.tw

聯絡方式:04-23590121轉33903

研究領域:

無線通訊射頻電路設計與積體電路設計
 

國科會計畫 :

1. 0.18 μm CMOS 2G Hz 與 5G Hz 頻帶微機電射頻濾波器之研製 ( 計畫主持人 )

產學研究計畫 :

1. The design of RJ-45 connector ( 計畫主持人 )

2. 微機電射頻濾波器之研製 ( 計畫主持人 )

3. 微機電感測器之研製 ( 共同主持人 )

學術研究 :

國際期刊 :

1. C.-P. Chang, C.-C. Su, S.-H. Hung, Y.-H. Wang, and J.-H. Chen, "A 6:1 Unequal Wilkinson Power Divider with EBG CPW," Progress In Electromagnetics Research Letters, vol. 8, 2009, pp. 151-159.

2. C.-P Chang. J.-H Chen and Y.-H. Wang, ”A Fully Integrated 5 GHz Low-Voltage LNA Using Forward Body Bias Technology,” IEEE Microwave and Wireless Components Letters, vol. 19,  iss. 3 ,  March 2009 pp. 176-178.

3. Chieh-Pin Chang, Jian-An Hou, Jionguang Su, Ja-Hao Chen, Chih-Wei Chen, Tsyr-Shyang Liou, Shyh-Chyi Wong, and Yeong-Her Wang,” A High Gain, Low Noise WLAN Receiver for Dual IF Double Down-Conversion Application in 90-nm RF CMOS, ”Microwave Optical Technology Letters, vol.49, no. 10, Oct. 2007, pp. 2422-2425

4. J.H. Chen, C.T. Wei, S.M. Hung, S.C. Wong and Y.H. Wang,“ Breakdown and stress-induced oxide degradation mechanisms in MOSFETs,”Solid State Electronics, vol.46, no.11,4, 2002, pp1965-197

5. J.H. Chen, C.T. Wei, S.C. Wong and Y.H. Wang, "Thin oxide breakdown breakdown mechanism of constant voltage stress on MOSFETs,” Physica Scripta, T101, pp10-13, 2002, Sweden

6. Ja-Hao Chen; Shyh-Chyi Wong; Yeong-Her Wang,”DC pulse hot-carrier-stress effects on gate-induced drain leakage current in n-channel MOSFETs”IEEE Transactions on Electron Devices, volume 48,  iss. 12 ,  Dec. 2001 pp:2746-2753

7. Ja-Hao Chen; Shyh-Chyi Wong; Yeong-Her Wang,” An analytic three-terminal band-to-band tunneling model on GIDL in MOSFETs”IEEE Transactions on Electron Devices, vol. 48,  iss. 7 ,  July 2001, pp. 1400 - 1405

國際研討會 :

1. J. H. Chen, C. T. Wei, S. C. Wong and Y. H. Wang, "Thin Oxide Breakdown Mechanism of Constant Voltage Stress on MOSFETs," Physica Scripta, No. T101, pp. 10~13, 2002.

2. J. H. Chen, C. T. Wei, S. M. Hung, S. C. Wong and Y. H. Wang, "Breakdown and stress-induced oxide degradation mechanisms in MOSFETs," Solid-State Electronics, Vol. 31, Iss. 11, pp. 1965~1974, November. 2002.

3. J.H. Chen, C.T. Wei, S.C. Wong and Y.H. Wang, "Thin Oxide Breakdown Mechanism of Constant Voltage Stress on MOSFETs" 19th Nordic Semiconductor Meeting, 2000.

國內研討會 :

1. J.H. Chen, Dec. 5-6, 2008 , “ 應用於 WLAN 射頻微機電濾波器之設 ,”Proceedings of National Symposium on Telecommunications (NST), Yunlin , Taiwan .

2. C.T. Wei, J.H. Chen , S.C. Wong and Y.H. Wang, "Investigation of Breakdown Mechanisms by Combination of Stresses," 1999 年中華民國電子材料與元件研討會 , p. 539, November, 1999

3. C.H. Kao, J.H. Chen, C.T. Wei, S.C. Wong and Y.H. Wang, "A subthreshold Current-Voltage Model for Asymmetric Trapezoidal Gate MOSFETs," 1998 International Electron Devices and Materials Symposia, Symoposium B, C, P. C3-4-P271, December, 1999

專利 :

1. " A single-ended input to differential-ended output low noise amplifier implemented with cascode and cascade topology" US 7375590

講授之課程 :

電路學、電磁學 、射頻電路設計、線性代數、射頻通訊積體電路、微波量測原理、射頻電路設計、

類比積體電路設計、超大型積體電路結構